On effective IDDQ testing of low voltage CMOS circuits using leakage control techniques

Proceedings - International Symposium on Quality Electronic Design, ISQED

Volumn 2000-January, Issue , 2000, Pages 181-188

  Chen, Zhanping ^a   Wei, Liqiong ^a   Roy, Kaushik ^a  

^a PURDUE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

VECTOR CONTROL (ELECTRIC MACHINERY);

DEFECTIVE CIRCUITS; EXPONENTIAL INCREASE; FAULT COVERAGES; LEAKAGE CONTROL; LOW THRESHOLDS; LOW VOLTAGE CIRCUITS; LOW-VOLTAGE CMOS CIRCUITS; VECTOR CONTROL TECHNIQUES;

CMOS INTEGRATED CIRCUITS;

EID: 0011797812     PISSN: 19483287     EISSN: 19483295     Source Type: Conference Proceeding    
DOI: 10.1109/ISQED.2000.838872     Document Type: Conference Paper

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