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Volumn 8-9, Issue , 1999, Pages 113-118

Methods of deposition and characterization of thin films of amphiphiles

Author keywords

Atomic force microscopy; Monolayer deposition; Vertical descent method

Indexed keywords


EID: 0011711436     PISSN: 09284931     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0928-4931(99)00082-X     Document Type: Article
Times cited : (4)

References (12)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.