A self-modeling approach to the resolution of XPS spectra into surface and bulk components

Journal of Electron Spectroscopy and Related Phenomena

Volumn 105, Issue 2-3, 1999, Pages 197-210

  Simmons, Gary W ^a   Angst, David L ^b   Klier, Kamil ^a  

^a LEHIGH UNIVERSITY   (United States)

^b NOKIA RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0011707893     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0368-2048(99)00066-3     Document Type: Article

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