Wavelength-modulated diffraction: A new method for phase determination

Acta Crystallographica Section A: Foundations of Crystallography

Volumn 55, Issue 5, 1999, Pages 864-870

  Iwasaki, H ^a   Yurugi, T ^a,b   Yoshimura, Y ^a  

^a RITSUMEIKAN UNIVERSITY   (Japan)

^b HITACHI LTD   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0011706357     PISSN: 01087673     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0108767399003219     Document Type: Article

References (9)

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