-
1
-
-
84975655810
-
Constraint on the optical constants of a film-substrate system for operation as an external-reflection retarder at a given angle of incidence
-
R. M. A. Azzam and B. E. Perilloux, “Constraint on the optical constants of a film-substrate system for operation as an external-reflection retarder at a given angle of incidence,” Appl. Opt. 24, 1171-1179 (1985).
-
(1985)
Appl. Opt.
, vol.24
, pp. 1171-1179
-
-
Azzam, R.M.A.1
Perilloux, B.E.2
-
2
-
-
0038124029
-
Periodic and quasiperiodic nonquarterwave multilayer coatings for 90-deg reflection phase retardance at 45-deg angle of incidence
-
M. M. K. Howlader and R. M. A. Azzam, “Periodic and quasiperiodic nonquarterwave multilayer coatings for 90-deg reflection phase retardance at 45-deg angle of incidence,” Opt. Eng. 34, 869-874 (1995).
-
(1995)
Opt. Eng.
, vol.34
, pp. 869-874
-
-
Howlader, M.M.K.1
Azzam, R.M.A.2
-
3
-
-
0019049789
-
Multilayer coating design achieving a broadband 90° phase shift
-
W. H. Southwell, “Multilayer coating design achieving a broadband 90° phase shift,” Appl. Opt. 19, 2688-2692 (1980).
-
(1980)
Appl. Opt.
, vol.19
, pp. 2688-2692
-
-
Southwell, W.H.1
-
4
-
-
0020091096
-
Phase retardance of periodic multilayer mirrors
-
J. H. Apfel, “Phase retardance of periodic multilayer mirrors,” Appl. Opt. 21, 733-738 (1982).
-
(1982)
Appl. Opt.
, vol.21
, pp. 733-738
-
-
Apfel, J.H.1
-
5
-
-
0020704093
-
Single-reflection filmsubstrate half-wave retarders with nearly stationary reflection properties over a wide range of incidence angles
-
R. M. A. Azzam and M. E. R. Khan, “Single-reflection filmsubstrate half-wave retarders with nearly stationary reflection properties over a wide range of incidence angles,” J. Opt. Soc. Am. 73, 160-166 (1983).
-
(1983)
J. Opt. Soc. Am.
, vol.73
, pp. 160-166
-
-
Azzam, R.M.A.1
Khan, M.E.R.2
-
7
-
-
0016486677
-
Ellipsometric function of a film-substrate system: Applications to the design of reflection-type optical devices and to ellipsometry
-
R. M. A. Azzam, A.-R. M. Zaghloul, and N. M. Bashara, “Ellipsometric function of a film-substrate system: applications to the design of reflection-type optical devices and to ellipsometry,” J. Opt. Soc. Am. 65, 252-260 (1975).
-
(1975)
J. Opt. Soc. Am.
, vol.65
, pp. 252-260
-
-
Azzam, R.M.A.1
Zaghloul, A.-R.M.2
Bashara, N.M.3
-
8
-
-
0020829261
-
Optical elements with ultrahigh spatial-frequency surface corrugation
-
R. C. Enger and S. K. Case, “Optical elements with ultrahigh spatial-frequency surface corrugation,” Appl. Opt. 22, 3220-3228 (1983).
-
(1983)
Appl. Opt.
, vol.22
, pp. 3220-3228
-
-
Enger, R.C.1
Case, S.K.2
-
9
-
-
84975609434
-
Zero-reflectivity homogeneous layers and high spatial-frequency surface-relief gratings on lossy materials
-
K. Gaylord, E. N. Glytsis, and M. G. Moharam, “Zero-reflectivity homogeneous layers and high spatial-frequency surface-relief gratings on lossy materials,” Appl. Opt. 26, 3123-3135 (1987).
-
(1987)
Appl. Opt.
, vol.26
, pp. 3123-3135
-
-
Gaylord, K.1
Glytsis, E.N.2
Moharam, M.G.3
-
10
-
-
77949401279
-
-
U.S. Patent 5,007,708 (16 April
-
K. Gaylord, E. N. Glytsis, M. G. Moharam, and W. E. Baird, “Technique for producing antireflection grating surfaces on dielectrics, semiconductors, and metals,” U.S. Patent 5,007,708 (16 April 1991).
-
(1991)
Technique for Producing Antireflection Grating Surfaces on Dielectrics, Semiconductors, and Metals
-
-
Gaylord, K.1
Glytsis, E.N.2
Moharam, M.G.3
Baird, W.E.4
-
11
-
-
0028441648
-
Homogeneous-layer models for high-spatial-frequency dielectric surface-relief gratings: Conical diffraction and antireflection designs
-
D. L. Brundrett, E. N. Glytsis, and T. K. Gaylord, “Homogeneous-layer models for high-spatial-frequency dielectric surface-relief gratings: conical diffraction and antireflection designs,” Appl. Opt. 33, 2695-2706 (1994).
-
(1994)
Appl. Opt.
, vol.33
, pp. 2695-2706
-
-
Brundrett, D.L.1
Glytsis, E.N.2
Gaylord, T.K.3
-
12
-
-
0001620676
-
Submicrometer-periodicity gratings as artificial dielectrics
-
D. C. Flanders, “Submicrometer-periodicity gratings as artificial dielectrics,” Appl. Phys. Lett. 42, 492-494 (1983).
-
(1983)
Appl. Phys. Lett.
, vol.42
, pp. 492-494
-
-
Flanders, D.C.1
-
13
-
-
0028531768
-
Artificial uniaxial and biaxial dielectrics with use of two-dimensional subwavelength binary gratings
-
E. B. Grann, M. G. Moharam, and D. A. Pommet, “Artificial uniaxial and biaxial dielectrics with use of two-dimensional subwavelength binary gratings,” J. Opt. Soc. Am. A 11, 2695-2703 (1994).
-
(1994)
J. Opt. Soc. Am. A
, vol.11
, pp. 2695-2703
-
-
Grann, E.B.1
Moharam, M.G.2
Pommet, D.A.3
-
14
-
-
84975604806
-
Antireflection surfaces in silicon using binary optics technology
-
M. E. Motamedi, W. H. Southwell, and W. J. Gunning, “Antireflection surfaces in silicon using binary optics technology,” Appl. Opt. 31, 4371-4376 (1992).
-
(1992)
Appl. Opt.
, vol.31
, pp. 4371-4376
-
-
Motamedi, M.E.1
Southwell, W.H.2
Gunning, W.J.3
-
15
-
-
0346012877
-
In-line quarter-wave retarders for the infrared using total refraction and total internal reflection in a prism
-
A. M. Kan’an and R. M. A. Azzam, “In-line quarter-wave retarders for the infrared using total refraction and total internal reflection in a prism,” Opt. Eng. 33, 2029-2033 (1994).
-
(1994)
Opt. Eng.
, vol.33
, pp. 2029-2033
-
-
Kan’an, A.M.1
Azzam, R.M.A.2
-
17
-
-
0015159677
-
Ellipsometry of anisotropic films
-
D. D. Engelsen, “Ellipsometry of anisotropic films,” J. Opt. Soc. Am. 61, 1460-1466 (1971).
-
(1971)
J. Opt. Soc. Am.
, vol.61
, pp. 1460-1466
-
-
Engelsen, D.D.1
-
18
-
-
36149028445
-
Reflection and refraction by uniaxial crystals
-
J. Lekner, “Reflection and refraction by uniaxial crystals,” J. Phys.: Condens. Matter 3, 6121-6133 (1991).
-
(1991)
J. Phys.: Condens. Matter
, vol.3
, pp. 6121-6133
-
-
Lekner, J.1
-
20
-
-
0020734417
-
Optical properties of the metals Al, Co, Cu, Au, Fe, Pb, Ni, Pd, Pt, Ag, Ti, and W in the infrared and far infrared
-
M. A. Ordal, L. L. Long, R. J. Bell, S. E. Bell, R. R. Bell, R. W. Alexander Jr., and C. A. Ward, “Optical properties of the metals Al, Co, Cu, Au, Fe, Pb, Ni, Pd, Pt, Ag, Ti, and W in the infrared and far infrared,” Appl. Opt. 22, 1099-1119 (1983).
-
(1983)
Appl. Opt.
, vol.22
, pp. 1099-1119
-
-
Ordal, M.A.1
Long, L.L.2
Bell, R.J.3
Bell, S.E.4
Bell, R.R.5
Alexander, R.W.6
Ward, C.A.7
|