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Volumn 65, Issue 4, 1998, Pages 131-136
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Telecentric systems for optical measurement and testing;Telezentrische Systeme für die optische Meß- Und Prüftechnik
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0011605451
PISSN: 01718096
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
Times cited : (13)
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References (7)
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