Compact External Cavity Diode Laser for Industrial Analysis;Kompakte External-cavity-dioden-laser für die industrielle Messtechnik

Technisches Messen

Volumn 68, Issue 9, 2001, Pages 374-379

  Hildebrandt, Lars ^a   Knispel, Richard ^a   Sacher, Joachim ^a  

^a Sacher Lasertechnik GmbH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ANTI-REFLECTION; EMISSION CHARACTERISTICS; EXTERNAL-CAVITY DIODE LASER; FABRY-PEROT LASER; FP LASER DIODES; INDUSTRIAL ANALYSIS; LOW-COST LASER SOURCE; TECHNICAL APPLICATIONS;

INSTRUMENTS; MEASUREMENTS;

LASER RESONATORS;

EID: 0011515652     PISSN: 01718096     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (6)

1. C.E. Wieman, L. Hollberg: "Using diode lasers for atomic physics"; Rev. Sci. Instrum. 62 (1), 1-19, 1991.
2. W. Demtröder: "Laserspektroskopie"; 4. Auflage, Springer, Berlin 2000.
3. T.W. Hänsch: "Repetitively Pulsed Tunable Dye Laser for High Resolution Spectroscopy "; Applied Optics, Vol. 11, No. 4, 895-898, 1972.
4. M.G. Littman, H.J. Metcalf: "Spectrally narrow pulsed dye laser without beam expander"; Applied Optics, Vol. 17, No. 14, 2224-2227, 1978.
5. K.B. MacAdam, A. Steinbach, C. Wieman: "A narrow-band tunable diode laser system with grating feedback, and a saturated absorption spectrometer for Cs and Rb"; Am. J. Phys. 60 (12), 1098-1111, 1992.
6. Die Messungen wurden freundlicherweise von Dr. Frank Schael, Universität Potsdam, durchgeführt.