Dependence of sensitivity of SnOx thin-film gas sensors on vacancy defects

Journal of Applied Physics

Volumn 80, Issue 10, 1996, Pages 6050-6054

  Vlachos, D S ^a   Papadopoulos, C A ^a   Avaritsiotis, J N ^a  

^a NATIONAL TECHNICAL UNIVERSITY OF ATHENS   (Greece)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0011460554     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.363562     Document Type: Review

References (14)

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