X-ray scattering studies of the passive oxide film formed on iron

Synchrotron Radiation News

Volumn 11, Issue 3, 1998, Pages 5-11

  Toney, Michael F ^a   Ryan, Mary P ^b   Oblonsky, Lucy j ^b   Davenport, Alison J ^c  

^a IBM ALMADEN RESEARCH CENTER   (United States)

^b BROOKHAVEN NATIONAL LABORATORY   (United States)

^c UNIVERSITY OF MANCHESTER   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0011342382     PISSN: 08940886     EISSN: 19317344     Source Type: Journal    
DOI: 10.1080/08940889808260927     Document Type: Article

References (29)

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27. In our initial experiments at +0.4 V, the potential was held for several hours before taking data and thus, we did not observe a time-dependence to the diffracted intensity. More recent experiments designed to look at time dependence at this potential showed that after the first four hours the diffraction peaks are, nearly saturated. Thus, time dependence did not influence the data described in the previous section
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