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Volumn 370, Issue 1, 1996, Pages 57-60
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Characterization of photolithographically defined NIS tunnel junctions as X-ray sensors
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0011277027
PISSN: 01689002
EISSN: None
Source Type: Journal
DOI: 10.1016/0168-9002(95)01048-3 Document Type: Article |
Times cited : (4)
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References (5)
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