Sub-natural-width angle-resolved resonant Auger electron spectroscopy of atoms and molecules on the high resolution soft X-ray monochromator at SPring-8

Journal of Electron Spectroscopy and Related Phenomena

Volumn 114-116, Issue , 2001, Pages 63-68

  Shimizu, Y ^a,b   Ohashi, H ^b   Tamenori, Y ^b   Muramatsu, Y ^a   Yoshida, H ^c   Okada, K ^c   Saito, N ^d   Tanaka, H ^e   Koyano, I ^f   Shin, S ^g,h   Ueda, K ^a  

^a TOHOKU UNIVERSITY   (Japan)

^b JAPAN SYNCHROTRON RADIATION RESEARCH INSTITUTE   (Japan)

^c HIROSHIMA UNIVERSITY   (Japan)

^d ELECTROTECHNICAL LABORATORY   (Japan)

^e SOPHIA UNIVERSITY   (Japan)

^f UNIVERSITY OF HYOGO   (Japan)

^g UNIVERSITY OF TOKYO   (Japan)

^h RIKEN   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CARBON MONOXIDE; ELECTRON ENERGY LEVELS; ELECTRON RESONANCE; ELECTRON TRANSITIONS; HIGH RESOLUTION ELECTRON MICROSCOPY; MOLECULAR DYNAMICS; MONOCHROMATORS; NEON;

X RAY MONOCHROMATORS;

AUGER ELECTRON SPECTROSCOPY;

EID: 0011252602     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0368-2048(00)00359-5     Document Type: Article

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