메뉴 건너뛰기




Volumn 389-393, Issue 1, 2002, Pages 395-398

Behavior of micropipes during growth in 4H-SiC

Author keywords

Micropipes; Partial dislocations; Stacking faults

Indexed keywords

ATOMIC FORCE MICROSCOPY; DISLOCATIONS (CRYSTALS); EPITAXIAL GROWTH; STACKING FAULTS; SYNCHROTRONS; TOPOGRAPHY; TRANSMISSION ELECTRON MICROSCOPY; TRENCHING; X RAY ANALYSIS; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;

EID: 0011213726     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/msf.389-393.395     Document Type: Article
Times cited : (10)

References (7)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.