Controlled bias ramping for scanning tunneling microscopy of molecular adsorbates

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

Volumn 14, Issue 3, 1996, Pages 1205-1207

  Roach, J S ^a   Musselman, I H ^a   Honeyman, J ^b  

^a UNIVERSITY OF TEXAS AT DALLAS   (United States)

^b Digital Instruments   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0011161530     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.580267     Document Type: Article

References (4)

1. G. Binnig, H. Rohrer, and E. Weibel, Appl. Phys. Lett. 40, 179 (1982).
2. J. Tersoff and D. R. Hamann, Phys. Rev. B 31, 805 (1985).
3. J. Frommer, Angew. Chem. Int. Ed. Eng. 31, 1298 (1992).
4. J. P. Rabe, Ultramicroscopy 42-44, 41 (1992).