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Journal of Applied Physics

Volumn 74, Issue 6, 1993, Pages 3936-3943

A method to correct for leakage current effects in deep level transient spectroscopy measurements on Schottky diodes

(4) Dmowski, K a Lepley, B b Losson, E b Bouabdellati, M El b

a WARSAW UNIVERSITY OF TECHNOLOGY (Poland)

b SUPELEC (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0011142880 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.354460 Document Type: Article

Times cited : (22)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.