Scanning Electron Microscopy as an Instrument of the Surface Conductivity Investigations

Scanning

Volumn 19, Issue 3, 1997, Pages 230-

  Dorozhkin, Sergey V ^a  

^a INSERM   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0011127921     PISSN: 01610457     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Conference Paper

References (2)

1. Dorozhkin SV, Nikolaev AL, Melikhov IV, Saparin GV, Bliadze VG: Chemical preparation of dielectrics for studying their microtopography by the SEM. Scanning 14, 112-117 (1992)
2. Dorozhkin SV: Chemical etching of natural fluorapatite crystals in acid solutions studied with the scanning electron microscope. Scanning 17, 355-360 (1995)