Study of 360° domain walls in NiFe/NiO film by tip-sample interaction on magnetic force microscope

Journal of Applied Physics

Volumn 87, Issue 9 III, 2000, Pages 6484-6486

  Zhao, T ^a   Hou, C ^a   Fujiwara, H ^a   Cho, H ^a   Harrell, J W ^a   Khapikov, A ^a  

^a University of Alabama   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0011112059     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.372745     Document Type: Article

References (13)

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