Scanning thermal profiler

Applied Physics Letters

Volumn 49, Issue 23, 1986, Pages 1587-1589

  Williams, C C ^a   Wickramasinghe, H K ^a  

^a IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0011095047     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.97288     Document Type: Article

References (4)