Modeling and analysis of experimental atomic force microscope images of hard colloidal particles

Computers and Chemistry

Volumn 21, Issue 3, 1997, Pages 129-139

  Marczewski, Adam W ^a,b   Higashitani, Ko ^a  

^a KYOTO UNIVERSITY   (Japan)

^b INSTITUTE OF CATALYSIS AND SURFACE CHEMISTRY   (Poland)

Author keywords

AFM; AFM modeling; AFM tip calibration; Atomic force microscopy

Indexed keywords

EID: 0011094530     PISSN: 00978485     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0097-8485(96)00033-2     Document Type: Article

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