Instabilities in electroluminescent porous silicon diodes

Applied Physics Letters

Volumn 69, Issue 6, 1996, Pages 833-835

  Linnros, J ^a   Lalic, N ^a   Knapek P ^b   Luterova K ^b   Kocka J ^b   Fejfar, A ^b   Pelant, I ^b  

^a ROYAL INSTITUTE OF TECHNOLOGY   (Sweden)

^b INSTITUTE OF PHYSICS   (Czech Republic)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0011024172     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.117907     Document Type: Article

References (18)

1. A. Richter, P. Steiner, F. Kozlowski, and W. Lang, IEEE Electron Device Lett. 12, 691 (1991) and P. Steiner, F. Kozlowski, and W. Lang, ibid. 14, 317 (1993).
2. A. Richter, P. Steiner, F. Kozlowski, and W. Lang, IEEE Electron Device Lett. 12, 691 (1991) and P. Steiner, F. Kozlowski, and W. Lang, ibid. 14, 317 (1993).
3. N. Koshida and H. Koyama, Appl. Phys. Lett. 60, 347 (1992).
4. F. Namavar, H. P. Maruska, and N. M. Kalkhoran, Appl. Phys. Lett. 60, 2514 (1992).
5. Z. Chen, G. Bosman, and R. Ochoa, Appl. Phys. Lett. 62, 708 (1993).
6. L. T. Canham, Appl. Phys. Lett. 57, 1046 (1990).
7. J. Linnros and N. Lalic, Appl. Phys. Lett. 66, 3048 (1995).
8. N. Lalic and J. Linnros, Thin Solid Films (in press).
9. A. Loni, A. J. Simons, T. I. Cox, P. D. J. Calcott, and L. T. Canham, Electron. Lett. 31, 1288 (1995).
10. D. B. Eason et al. Appl. Phys. Lett. 66, 115 (1995).
11. L. Zhang, J. L. Coffer, B. E. Gnade, DaXue Xu, and R. F. Pinizzotto, J. Appl. Phys. 77, 5936 (1995).
12. A. Diligenti, A. Nannini, G. Pennelli, and F. Pieri, Appl. Phys. Lett. 68, 687 (1996).
13. M. Ben-Chorin, F. Möller, and F. Koch, Phys. Rev. B 49, 2981 (1994).
14. A. Fejfar, I. Pelant, E. Šípek, J. Kočka, G. Juška, T. Matsumoto, and Y. Kanemitsu, Appl. Phys. Lett. 66, 1098 (1995).
15. J. Kočka, I. Pelant, and A. Fejfar, 16th ICAS, Kobe 1995 J. Non-Cryst. Solids (to be published).
16. R. Laiho and A. Pavlov, Thin Solid Films 255, 276 (1995).
17. Note that the activation energy derived in case 1, refers to zero external voltage while for case 2, a forward voltage is applied.
18. S. Schuppler, S. L. Friedman, M. A. Marcus, D. L. Adler, Y.-H. Xie, F. M. Ross, T. D. Harris , W. L. Brown, Y. J. Chabal, L. E. Brus, and P. H. Citrin, Phys. Rev. Lett. B 72, 2648 (1994).