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Physical Review B

Volumn 9, Issue 7, 1974, Pages 2870-2878

Depth profiling of He3 and H2 in solids using the He3(d, p)He4 resonance

(2) Pronko, P P a Pronko, J G b

a ARGONNE NATIONAL LABORATORY (United States)

b Palo Alto Research Laboratory (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0010982669 PISSN: 01631829 EISSN: None Source Type: Journal
DOI: 10.1103/PhysRevB.9.2870 Document Type: Article

Times cited : (60)

References (13)

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6
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- Williamson, C.F.¹ Boujot, J.P.² Picard, J.³

7
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- No. 9
- (1966) Mat. Fys. Medd. Dan. Vidensk. Selsk. , vol.35
- Schiott, H.E.¹

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- 0000827191
- No. 14
- (1963) Mat. Fys. Medd. Dan. Vidensk. Selsk. , vol.33
- Lindhard, J.¹ Scharff, M.² Schiott, H.E.³

9
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- 3rd, ed., edited by, D. E. Gray, McGraw-Hill, New York, Sec. 8, p.
- (1972) American Institute of Physics Handbook , pp. 176

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- (1971) J. Appl. Phys. , vol.42 , pp. 7031
- Ziegler, J.F.¹ Baglin, J.W.²

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- Charged Particle Cross Sections
- Los Alamos Scientific Laboratories, University of California
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12
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- Tschalär, C.¹

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- Scott, W.T.¹

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.