Final design, assembly, and testing of a space-based total integrated scatter instrument

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3141, Issue , 1997, Pages 209-219

  Hadaway, James B ^a   Ahmad, Anees ^a   Bennett, Jean M ^b  

^a UNIVERSITY OF ALABAMA IN HUNTSVILLE   (United States)

^b NAVAL AIR WARFARE CENTER   (United States)

Author keywords

Environmental effects; Materials; Total integrated scatter

Indexed keywords

FRICTION; INSTRUMENT TESTING; METEOROLOGICAL INSTRUMENTS; NASA; OPTICAL PROPERTIES; ORBITS; SPACE STATIONS; SURFACE PROPERTIES; SURFACE ROUGHNESS;

ENVIRONMENTAL EFFECTS; HUNTSVILLE (CO); LOW EARTH ORBIT (LOE); MATERIALS; MIR SPACE STATION; SCATTEROMETER; SURFACE CONTAMINATIONS; SURFACE ROUGHENING; TOTAL INTEGRATED SCATTER;

SURFACES;

EID: 0010941872     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.287796     Document Type: Conference Paper

References (8)

1. J. L. Pezzaniti, J. B. Hadaway, R. A. Chipman, D. Wilkes, L. Hummer, and J. Bennett, "Total Integrated Scatter instrument for in-space monitoring of surface degradation", Optical System Contamination: Effects, Measurement, Control II, A.P. Glassford, ed., v. 1329, SPIE, Bellingham, WA, 1990.
2. D.W. Wilkes, J.M. Bennett, and L.L. Hummer, Optical Properties Monitor Experiment Definition Phase Final Report, NASA Contractor Report 4293, 1990.
3. P.N. Peters, J.C. Gregory, and J.T. Swann, "Effects on optical systems from interactions with oxygen atoms in low earth orbits," Appl. Opt. 25(8), pp. 1290-1298, 1986.
4. B.D. Green, "The particle environment on-orbit: observations, calculations, and implications," Adv. In Space Res. 7(5), p. 161, 1987.
5. J.M. Bennett and L. Mattsson, Introduction to Surface Roughness and Scattering, Chpt.3 & 4, Optical Society of America, Washington, D.C., 1989.
6. H.E. Bennett and J.O. Porteus, "Relation between surface roughness and specular reflectance at normal incidence," J. Opt. Soc. Am. 51, pp. 123-129, 1961.
7. C.J. Bruegge, A.E. Stiegman, R.A. Rainen, and A.W. Springsteen, "Use of Spectralon as a diffuse reflectance standard for in-flight calibration of earth-orbiting sensors," Opt. Eng. 32(4), pp. 805-814, 1993.
8. A.E. Stiegman, C.J. Bruegge, and A.W. Springsteen, "Ultraviolet stability and contamination analysis of Spectralon diffuse reflectance material," Opt. Eng. 32(4), pp. 799-804, 1993.