Comparison of shortwave and longwave measuring thermal-imaging systems

Applied Optics

Volumn 34, Issue 16, 1995, Pages 2888-2897

  Chrzanowski, K ^a  

^a MILITARY UNIVERSITY OF TECHNOLOGY   (Poland)

Author keywords

Infrared systems; Remote temperature measurement; Thermal imaging systems

Indexed keywords

EID: 0010939274     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.34.002888     Document Type: Article

References (12)

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