Microfocus soft X-ray source generated by a compact high power laser-plasma

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4144, Issue , 2000, Pages 1-15

  Turcu, I C E ^a   Rieger, H ^a   Vladimirsky, Y ^a   Grygier, R ^a   Powers, M ^a   Naungayan, J ^a   Campeau, S ^a   French, G ^a   Forber, R ^a   Foster, R ^a  

^a JMAR Technologies Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FLUORESCENCE; HIGH POWER LASERS; LASER PRODUCED PLASMAS; PHOTONS; POWER AMPLIFIERS; REFLECTOMETERS; SEMICONDUCTING GALLIUM ARSENIDE; SPECTRUM ANALYSIS; ULTRAVIOLET RADIATION; X RAY ANALYSIS; X RAY LITHOGRAPHY; X RAY TUBES;

PICOSECOND SOFT X RAY SOURCES (PXS);

SEMICONDUCTOR LASERS;

EID: 0010834706     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.405882     Document Type: Conference Paper

References (5)