A theoretical determination of the depth of the surface effect on impurity in semiconductors

Journal of Physics: Condensed Matter

Volumn 1, Issue 12, 1989, Pages 2225-2233

  Tseng, Hsiang Chi ^a   Shan, Yueh ^a  

^a NATIONAL TSING HUA UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0010828227     PISSN: 09538984     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-8984/1/12/007     Document Type: Article

References (10)