Scanning acoustic tunneling microscopy and spectroscopy: A probing tool for acoustic surface oscillations

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 15, Issue 4, 1997, Pages 1569-1572

  Hesjedal, T ^a   Chilla, E ^a   Frohlich H J ^a  

^a PAUL DRUDE INSTITUT FÜR FESTKÖRPERELEKTRONIK   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0010780976     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.589402     Document Type: Article

References (22)

1. K. D. Wise and K. Najafi, Science 254, 1335 (1991).
2. R. Kuschnereit, H. Path, A. A. Kolomenskii, M. Szabadi, and P. Hess, Appl. Phys. A 61, 269 (1995).
3. H. Nishino, Y. Tsukahara, Y. Nagata, T. Koda, and K. Yamamaka, Appl. Phys. Lett. 62, 2036 (1993).
4. P. Hess, Photoacoustic, Photothermal and Photochemical Processes (Springer, Berlin, 1989).
5. J. Kushibiki, T. Ueda, and N. Chubachi, Proceedings of the 1985 IEEE Ultrasonics Symposium (IEEE, New York, 1985).
6. R. Nötzel and K. Ploog, Int. J. Mod. Phys. B 7, 2743 (1993).
7. C. Thomsen, H. T. Grahn, H. J. Maris, and J. Taue, Phys. Rev. B 34, 4219 (1986).
8. W. Rohrbeck and E. Chilla, Phys. Status Solidi A 131, 69 (1992); E. Chilla, H.-J. Fröhlich, J. Riedel, and W. Rohrbeck, Proceedings of the 8th Tagung Akustik/ 11. Winterschule Mikroakustik (Phys. Gesellschaft, Berlin, 1989) (in German).
9. W. Rohrbeck and E. Chilla, Phys. Status Solidi A 131, 69 (1992); E. Chilla, H.-J. Fröhlich, J. Riedel, and W. Rohrbeck, Proceedings of the 8th Tagung Akustik/ 11. Winterschule Mikroakustik (Phys. Gesellschaft, Berlin, 1989) (in German).
10. E. Chilla, W. Rohrbeck, H.-J. Fröhlich, R. Koch, and K. H. Rieder, Appl. Phys. Lett. 61, 3107 (1992); Ann. Phys. (Leipzig) 3, 21 (1994).
11. E. Chilla, W. Rohrbeck, H.-J. Fröhlich, R. Koch, and K. H. Rieder, Appl. Phys. Lett. 61, 3107 (1992); Ann. Phys. (Leipzig) 3, 21 (1994).
12. M. R. Freeman and G. Nunes, Jr., Appl. Phys. Lett. 63, 1200 (1993).
13. S. Weiss, D. F. Ogletree, D. Botkin, M. Salmeron, and D. S. Chenla, Appl. Phys. Lett. 63, 2567 (1993).
14. S. J. Stranik and P. S. Weiss, Rev. Sci. Instrum. 65, 918 (1994).
15. K. Besocke, Surf. Sci. 181, 145 (1987).
16. T. Hesjedal, E. Chilla, and H.-J. Fröhlich (unpublished data).
17. S. Makarov, E. Chilla, and H.-J. Fröhlich, J. Appl. Phys. 78, 5028 (1995).
18. J. Heil, J. Wesner, and W. Grill, J. Appl. Phys. 64, 1939 (1988).
19. D. W. Abraham, C. C. Williams, and H. K. Wickramasinghe, Appl. Phys. Lett. 53, 1503 (1988).
20. T. Hesjedal, E. Chilla, and H.-J. Fröhlich, Appl. Phys. Lett. 69, 354 (1996).
21. K. Takata, T. Hasegawa, S. Hosaka, S. Hosoki, and T. Komoda, Appl. Phys. Lett. 55, 1718 (1989).
22. D. Schneider, T. Schwarz, and B. Schultrich, Thin Solid Films 219, 92 (1992).