On surface plasmons in porous silicon: Measurements of the electron energy loss in etched silicon nanocrystals

Applied Physics Letters

Volumn 69, Issue 2, 1996, Pages 206-208

  Massami Sassaki, R ^a   Galembeck, F ^a   Teschke, O ^a  

^a UNIVERSITY OF CAMPINAS   (Brazil)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0010756701     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.117373     Document Type: Article

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