Impact of excess low frequency noise (ELFN) in Si:As impurity band conduction (IBC) focal plane arrays for astronomical applications

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3379, Issue , 1998, Pages 361-370

  Arrington, Douglas C ^a   Hubbs, John E ^a   Gramer, Mark E ^a   Dole, Gary A ^a  

^a BALL AEROSPACE AND TECHNOLOGIES CORP   (United States)

Author keywords

Detector noise; Excess low frequency noise (ELFN); Impurity band conduction (IBC) detector; Infrared focal plane array (IRFPA); Signal to noise ratio; Very long wavelength

Indexed keywords

ACOUSTIC INTENSITY; ARSENIC; ASTROPHYSICS; FOCAL PLANE ARRAYS; FOCUSING; HEAT CONDUCTION; INFRARED DETECTORS; PHOTONS; SIGNAL TO NOISE RATIO; SILICON; SILICON DETECTORS; SPURIOUS SIGNAL NOISE; THERMAL NOISE;

DETECTOR NOISE; EXCESS LOW FREQUENCY NOISE (ELFN); IMPURITY BAND CONDUCTION (IBC) DETECTOR; INFRARED FOCAL PLANE ARRAY (IRFPA); VERY LONG WAVELENGTH;

DETECTORS;

EID: 0010752541     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.317603     Document Type: Conference Paper

References (2)

1. M. D. Petroff and M. G. Stapelbroek, "Responsivity and Noise Models of Blocked Impurity Detectors," IRIS Specialty Group on IR Detectors, Seattle, August, 1884.
2. M. G. Stapelbroek, M. D. Petroff, J. J. Speer, and R. Bharat, "Origin of Excess Low-Frequency Noise at Intermediate Backgrounds In BIB Detectors," IRIS Specialty Group on IR Detectors, Seattle, August, 1984.