메뉴 건너뛰기




Volumn 48, Issue 2, 1999, Pages 626-630

A new 60 GHz open-resonator technique for precision permittivity and loss-tangent measurement

Author keywords

Cavity length variation technique; Loss tangent; Millimeter wave; Open resonator; Permittivity; Refractive index

Indexed keywords


EID: 0010672342     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/19.769673     Document Type: Article
Times cited : (36)

References (14)
  • 1
    • 0001668284 scopus 로고
    • The accurate measurement of permittivity by means of an open resonator
    • A.L. Cullen and P. K. Yu, "The accurate measurement of permittivity by means of an open resonator," Proc. R. Soc. Lond. A, vol. 325, pp. 493-509, 1971.
    • (1971) Proc. R. Soc. Lond. A , vol.325 , pp. 493-509
    • Cullen, A.L.1    Yu, P.K.2
  • 2
    • 0016359037 scopus 로고
    • Comparison of cavity and open-resonator measurements of permittivity and loss angle at 35 GHz
    • Dec.
    • R.J. Cook, R. G. Jones, and C. B. Rosenberg, "Comparison of cavity and open-resonator measurements of permittivity and loss angle at 35 GHz," IEEE Trans. Instrum. Meas., vol. IM-23, pp. 438-442, Dec. 1974.
    • (1974) IEEE Trans. Instrum. Meas. , vol.IM-23 , pp. 438-442
    • Cook, R.J.1    Jones, R.G.2    Rosenberg, C.B.3
  • 3
    • 0020477189 scopus 로고
    • Measurement of permittivity by means of an open resonator: I. Theoretical
    • P.K. Yu and A. L. Cullen, "Measurement of permittivity by means of an open resonator: I. Theoretical," Proc. R. Soc. Lond. A, vol. 380, pp. 49-71, 1982.
    • (1982) Proc. R. Soc. Lond. A , vol.380 , pp. 49-71
    • Yu, P.K.1    Cullen, A.L.2
  • 4
    • 0020477193 scopus 로고
    • Measurement of permittivity by means of an open resonator: II. Experimental
    • A.C. Lynch, "Measurement of permittivity by means of an open resonator: II. Experimental," Proc. R. Soc. Lond. A, vol. 380, pp. 73-76, 1982.
    • (1982) Proc. R. Soc. Lond. A , vol.380 , pp. 73-76
    • Lynch, A.C.1
  • 5
    • 0025535623 scopus 로고
    • An automated 60 GHz open resonator system for precision dielectric measurement
    • Dec.
    • M.N. Afsar, X. Li, and H. Chi, "An automated 60 GHz open resonator system for precision dielectric measurement," IEEE Trans. Microwave Theory Tech., vol. 39, pp. 1845-1853, Dec. 1990.
    • (1990) IEEE Trans. Microwave Theory Tech. , vol.39 , pp. 1845-1853
    • Afsar, M.N.1    Li, X.2    Chi, H.3
  • 7
    • 0026239450 scopus 로고
    • Open resonator for precision dielectric measurements in the 100 GHz band
    • Oct.
    • B. Komiyama, M. Kiyokawa, and T. Matsui, "Open resonator for precision dielectric measurements in the 100 GHz band," IEEE Trans. Microwave Theory Tech., vol. 39, pp. 1792-1796, Oct. 1991.
    • (1991) IEEE Trans. Microwave Theory Tech. , vol.39 , pp. 1792-1796
    • Komiyama, B.1    Kiyokawa, M.2    Matsui, T.3
  • 8
    • 0030213095 scopus 로고    scopus 로고
    • Measurement of dielectrics at 100 GHz with an open resonator connected to a network analyzer
    • Aug.
    • T.M. Hirvonen, p. Vainikainen, A. Lozowski, and A. V. Raisanen, "Measurement of dielectrics at 100 GHz with an open resonator connected to a network analyzer," IEEE Trans. Instrum. Meas., vol. 45, pp. 780-786, Aug. 1996.
    • (1996) IEEE Trans. Instrum. Meas. , vol.45 , pp. 780-786
    • Hirvonen, T.M.1    Vainikainen, P.2    Lozowski, A.3    Raisanen, A.V.4
  • 9
    • 33644972135 scopus 로고
    • Measurement of permittivity and dielectric loss with a millimeter wave Fabry-Perot interferometer
    • W. Culshaw and M. V. Anderson, "Measurement of permittivity and dielectric loss with a millimeter wave Fabry-Perot interferometer," Proc. Inst. Elect. Eng., vol. 109, pt. B, suppl. 23, pp. 820-826, 1962.
    • (1962) Proc. Inst. Elect. Eng. , vol.109 , Issue.23 PART B AND SUPPL. , pp. 820-826
    • Culshaw, W.1    Anderson, M.V.2
  • 10
    • 84918021329 scopus 로고
    • A quasioptics perturbation technique for measuring dielectric constants
    • Apr.
    • J.E. Degenford and P. D. Coleman, "A quasioptics perturbation technique for measuring dielectric constants," Proc. IEEE, vol. 54, pp. 520-522, Apr. 1966.
    • (1966) Proc. IEEE , vol.54 , pp. 520-522
    • Degenford, J.E.1    Coleman, P.D.2
  • 11
    • 0021576448 scopus 로고
    • Dielectric measurements of millimeter-wave materials
    • Dec.
    • M.N. Afsar, "Dielectric measurements of millimeter-wave materials," IEEE Trans. Microwave Theory Tech., vol. MTT-32, pp. 1598-1608, Dec. 1984.
    • (1984) IEEE Trans. Microwave Theory Tech. , vol.MTT-32 , pp. 1598-1608
    • Afsar, M.N.1
  • 12
    • 0022732840 scopus 로고
    • Precision millimeter wave dielectric measurements of birefringent crystalline sapphire and ceramic alumina
    • June
    • M.N. Afsar, "Precision millimeter wave dielectric measurements of birefringent crystalline sapphire and ceramic alumina," IEEE Trans. Instrum. Meas., vol. IM-36, pp. 554-561, June 1987.
    • (1987) IEEE Trans. Instrum. Meas. , vol.IM-36 , pp. 554-561
    • Afsar, M.N.1
  • 13
    • 84891258104 scopus 로고
    • Precision millimeter-wave measurements of complex refractive index, complex dielectric permittivity, and loss tangent of common polymers
    • June
    • M.N. Afsar, "Precision millimeter-wave measurements of complex refractive index, complex dielectric permittivity, and loss tangent of common polymers," IEEE Trans. Instrum. Meas., vol. IM-36, pp. 530-536, June 1987.
    • (1987) IEEE Trans. Instrum. Meas. , vol.IM-36 , pp. 530-536
    • Afsar, M.N.1
  • 14
    • 0016939280 scopus 로고
    • The measurement of dielectric anisotropy using a microwave open resonator
    • R.G. Jones, "The measurement of dielectric anisotropy using a microwave open resonator," J. Phys. D: Appl. Phys., vol. 9, pp. 819-827, 1976.
    • (1976) J. Phys. D: Appl. Phys. , vol.9 , pp. 819-827
    • Jones, R.G.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.