Processing speckle patterns with model trained neural networks

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3172, Issue , 1997, Pages 287-295

  Decker, Arthur J ^a   Fite, E Brian ^a   Mehmed, Oral ^a   Thorp, Scott A ^a  

^a NASA GLENN RESEARCH CENTER   (United States)

Author keywords

Electronic holography; Models; Neural networks; Speckle patterns

Indexed keywords

ARTIFICIAL NEURAL NETWORKS; COMPUTATIONAL MODELS; ELECTRONIC HOLOGRAPHIES; ELECTRONIC HOLOGRAPHY; FINITE ELEMENT MODELS; FINITE ELEMENTS; FRINGE PATTERNS; LASER SPECKLES; PROCESS PATTERNS; REAL STRUCTURES; SIMPLE MODELS; SPECKLE PATTERNS; SPEED PROCESSORS; STRUCTURAL DAMAGES; TRAINED NEURAL NETWORKS;

BACKPROPAGATION; COMBUSTION; DATA RECORDING; FINITE ELEMENT METHOD; HOLOGRAPHIC INTERFEROMETRY; HOLOGRAPHY; LASER RECORDING; LASERS; MOIRE FRINGES; OPTICAL INSTRUMENTS; SMOKE; SPECKLE; THERMOCHEMISTRY;

NEURAL NETWORKS;

EID: 0010671007     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.279741     Document Type: Conference Paper

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