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Volumn , Issue , 2000, Pages 21-27
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Emerging trends in VLSI test and diagnosis
a
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Author keywords
[No Author keywords available]
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Indexed keywords
APPLICATION SPECIFIC INTEGRATED CIRCUITS;
BUDGET CONTROL;
COMMERCE;
CONCURRENT ENGINEERING;
INTEGRATED CIRCUITS;
SEMICONDUCTOR DEVICE MANUFACTURE;
SEMICONDUCTOR DEVICES;
DIAGNOSIS METHODS;
EMBEDDED TESTS;
EMERGING TRENDS;
SEMICONDUCTOR TECHNOLOGY;
SYSTEM VERIFICATIONS;
TIME TO MARKET;
VERY DEEP SUB MICRONS;
VLSI TESTS;
PROGRAM DEBUGGING;
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EID: 0010637114
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/IWV.2000.844524 Document Type: Conference Paper |
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Times cited : (5)
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References (0)
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