Characterization of differential interconnects from time domain reflectometry measurements

Proceedings of the International Spring Seminar on Electronics Technology

Volumn 2001-January, Issue , 2001, Pages 298-301

  Tolescu, A ^a   Svasta, P ^a  

^a UNIVERSITY POLITEHNICA OF BUCHAREST   (Romania)

Author keywords

[No Author keywords available]

Indexed keywords

CONCURRENT ENGINEERING; ELECTRONICS PACKAGING; PERMITTIVITY MEASUREMENT; REFLECTION; REFLECTOMETERS; SPICE;

COUPLED TRANSMISSION LINE; DIFFERENTIAL INTERCONNECTS; DIFFERENTIAL SIGNALING; DISTRIBUTED MODELING; HIGH-SPEED DIGITAL DESIGN; INTERCONNECT MODELING; PERFORMANCE SYSTEM DESIGNS; TIME DOMAIN REFLECTOMETRY;

TIME DOMAIN ANALYSIS;

EID: 0010612182     PISSN: 21612528     EISSN: 21612536     Source Type: Conference Proceeding    
DOI: 10.1109/ISSE.2001.931087     Document Type: Conference Paper

References (5)

1. D. Smolyansky and S.D. Corey. "Printed circuit board characterization from TDR measurements, "Printed Circuit Design Magazine, May 1999
2. Lee W. Ritchey "How to design a differential signaling circuit, "Printed Circuit Design Magazine, March 1999
3. F. Romeo and M. Santomauro, "Time domain simulation of n coupled transmission line, "IEEE Transaction on Microwave Theory and Techniques, Vol.35, No. 2, February 1987
4. L.A. Hayden and V.K. Tripathi, "Characterization and Modeling of Multiple Line Interconnections from TDR Measurements, "IEEE Transactions on Microwave Theory and Techiques, Vol. 42, September 1994
5. C.W. Hsue and T.W. Pan, "Reconstruction of nonuniform Transmission Lines from Time-domain Reflectometry, "IEEE Transactions on Microwave Theory and Techiques, Vol.45, No.1 January 1997.