메뉴 건너뛰기




Volumn 38, Issue 4, 1999, Pages 695-703

Emission pattern of real vapor sources in high vacuum: An overview

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0010606748     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.38.000695     Document Type: Article
Times cited : (26)

References (3)
  • 3
    • 0025635478 scopus 로고
    • Thickness distribution of evap-orated films
    • R. Herrmann, ed., Proc. SPIE 1270
    • A. Musset and I. C. Stevenson, “Thickness distribution of evap-orated films,” in Optical Thin Films and Applications, R. Herrmann, ed., Proc. SPIE 1270, 287-291 (1990).
    • (1990) Optical Thin Films and Applications , pp. 287-291
    • Musset, A.1    Stevenson, I.C.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.