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Volumn 8, Issue 10, 1996, Pages 1389-1401
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Measuring transport anisotropy in Cu/Si multilayers using weak localization
a a |
Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0010598736
PISSN: 09538984
EISSN: None
Source Type: Journal
DOI: 10.1088/0953-8984/8/10/011 Document Type: Article |
Times cited : (5)
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References (20)
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