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Volumn 8, Issue 10, 1996, Pages 1389-1401

Measuring transport anisotropy in Cu/Si multilayers using weak localization

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0010598736     PISSN: 09538984     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-8984/8/10/011     Document Type: Article
Times cited : (5)

References (20)
  • 11
    • 0026622782 scopus 로고
    • Szott W, Jedrezejek C and Kirk W P 1989 Phys. Rev. B 40 1790; 1992 Superlatt. Microstruct. 11 199
    • (1992) Superlatt. Microstruct. , vol.11 , pp. 199
  • 16
    • 0027557909 scopus 로고
    • Sumanasekara G, Williams B D, Baxter D V and Carini J P 1994 Phys. Rev. B 50 2606; 1993 Solid State Commun. 85 941
    • (1993) Solid State Commun. , vol.85 , pp. 941


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.