Hardness and dielectric characteristics of flux grown terbium aluminate crystals

Materials Science and Engineering B

Volumn 57, Issue 3, 1999, Pages 197-208

  Sharma, K K ^a   Kotru, P N ^a   Tandon, R P ^b   Wanklyn, B M ^c  

^a UNIVERSITY OF JAMMU   (India)

^b NATIONAL PHYSICAL LABORATORY   (India)

^c UNIVERSITY OF OXFORD   (United Kingdom)

Author keywords

Conductivity; Dielectric; Flux grown; Hardness

Indexed keywords

ANISOTROPY; BRITTLENESS; CRYSTAL GROWTH; DIELECTRIC LOSSES; ELECTRIC CONDUCTIVITY OF SOLIDS; FRACTURE TOUGHNESS; PERMITTIVITY; THERMAL EFFECTS; VICKERS HARDNESS TESTING; YIELD STRESS;

PALMQVIST CRACKS; TERBIUM ALUMINATE CRYSTALS;

TELLURIUM COMPOUNDS;

EID: 0010569821     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-5107(98)00423-1     Document Type: Article

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