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Volumn 188, Issue 4, 2001, Pages 1331-1338

Spectroscopic ellipsometry for characterization and monitoring of organic layers

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0010549092     PISSN: 00318965     EISSN: None     Source Type: Journal    
DOI: 10.1002/1521-396X(200112)188:4<1331::AID-PSSA1331>3.0.CO;2-1     Document Type: Article
Times cited : (6)

References (21)
  • 18
    • 0001817946 scopus 로고    scopus 로고
    • Ellipsometry
    • Eds. A. BASZKIN and W. NORDE, Marcel Dekker Inc.
    • H. ARWIN, Ellipsometry, in: Physical Chemistry of Biological Interfaces, Eds. A. BASZKIN and W. NORDE, Marcel Dekker Inc., 2000 (pp. 577-607).
    • (2000) Physical Chemistry of Biological Interfaces , pp. 577-607
    • Arwin, H.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.