A photospectrometer realized in a standard integrated circuit process

Review of Scientific Instruments

Volumn 69, Issue 1-2, 1998, Pages 377-383

  Simpson, Michael L ^a   Dress, William B ^a   Ericson, M Nance ^a   Jellison, Gerald E ^a   Sitter, David N ^a   Wintenberg, Alan L ^a   French, David F ^b  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

^b The University of Tennessee   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0010527570     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1148457     Document Type: Article

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