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Volumn 68, Issue 23, 1996, Pages 3278-3280

Observation of boron doping induced surface roughening in silicon molecular beam epitaxy

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0010482332     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.116573     Document Type: Article
Times cited : (5)

References (22)
  • 19
    • 21544471443 scopus 로고    scopus 로고
    • K. D. Hobart, D. J. Godbey, P. E. Thompson, and D. S. Simons, J. Vac. Sci. Technol. B 11, 1115 (1993); Appl. Phys. Lett. 63, 1381 (1993); S. A. Barnett, H. F. Winters, and J. E. Greene, Surf. Sci. 165, 303 (1986).
    • K. D. Hobart, D. J. Godbey, P. E. Thompson, and D. S. Simons, J. Vac. Sci. Technol. B 11, 1115 (1993); Appl. Phys. Lett. 63, 1381 (1993); S. A. Barnett, H. F. Winters, and J. E. Greene, Surf. Sci. 165, 303 (1986).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.