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Volumn 13, Issue 7, 1996, Pages 1448-1455

Second-order radiometric ray tracing

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EID: 0010443672     PISSN: 10847529     EISSN: 15208532     Source Type: Journal    
DOI: 10.1364/JOSAA.13.001448     Document Type: Article
Times cited : (9)

References (23)
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