Standards for reflectance measurements: Selection and use: A primer - Part II

Spectroscopy (Santa Monica)

Volumn 15, Issue 6, 2000, Pages 22-25

  Springsteen, Art ^a  

^a NONE

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Indexed keywords

EID: 0010437910     PISSN: 08876703     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (9)

1. J.D. Lindberg, Applied Optics 26, 2900 (1987).
2. V.R. Weidner, Applied Optics 25, 1265 (1986).
3. A.W. Springsteen, J.E. Leland, and T.M. Ricker, Guide to Reflectance Materials and Coatings (Labsphere, North Sutton, NH, 1994).
4. Springsteen, U.S. Patent #5,462,705 and succeeding patents.
5. Standard Practice for Transfer Standards for Reflectance Factor for Near-Infrared Using Hemispherical Geometry. ASTM Standard E1791-96. (ASTM, West Conshohocken, PA).
6. V.R. Weidner, P.Y. Barnes, and K.L. Eckerle, Journal of Research of the National Bureau of Standards 91, 243 (1986).
7. F.J.J. Clarke and J.A. Larkin, "Improved Techniques for the NPL Hemispherical Reflectomeler," in Proceedings of the SPIE 917, 7 (1988).
8. F.J.J. Clarke and J.A. Larkin, High Temperatures-High Pressures 17, 89 (1985).
9. R.R. Wiley, "Results of a Round-Robin Measurement of Spectral Emittance in the Mid-IR," in Proceedings of the SPIE 10, 807 (1987).