Practical interferometric solutions for increasing test coverage for high precision optical manufacturing

Optics InfoBase Conference Papers

Volumn , Issue , 2000, Pages 80-81

  McKeever, Chris ^a   VanKerkhove, Steven ^a  

^a Tropel Corporation ^*  (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INTERFEROMETRY;

HIGH-PRECISION; INTERFEROMETRICS; LATERAL SHEAR; MANUFACTURING FACILITY; OPTICAL MANUFACTURING; PRACTICAL METHOD; SUBAPERTURE; SURFACE COVERAGES; TEST-COVERAGE;

MANUFACTURE;

EID: 0010436690     PISSN: None     EISSN: 21622701     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (1)

1. W. H. Southwell, "Wave-front estimation from wave-front slope measurements", J. Opt. Soc. Am., 70, No 8 (1980)