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Surface Science

Volumn 162, Issue 1-3, 1985, Pages 875-885

Composition depth information from the inelastic background signal in XPS

(1) Tougaard, S a

a UNIVERSITY OF SOUTHERN DENMARK (Denmark)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0010334411 PISSN: 00396028 EISSN: None Source Type: Journal
DOI: 10.1016/0039-6028(85)90992-6 Document Type: Article

Times cited : (44)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.