Experimental X-ray study of the correlation between the film and the substrate roughness

Kristallografiya

Volumn 43, Issue 1, 1998, Pages 119-130

  Asadchikov, V E ^a   Karbekov, A Yu ^a   Klechkovskaya, V V ^a   Kozhevnikov, I V ^a   Levashov, V E ^a   Sagitov, S I ^a  

^a NONE

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[No Author keywords available]

Indexed keywords

EID: 0010268128     PISSN: 00234761     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (20)

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