Streaked x-ray diagnostic for Double EAGLE z-pinch radiation sources

Review of Scientific Instruments

Volumn 70, Issue 1 II, 1999, Pages 569-571

  Failor, B H ^b   Coverdale, C A ^a,b  

^a SANDIA NATIONAL LABORATORIES   (United States)

^b MAXWELL TECHNOLOGIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0010248795     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1149307     Document Type: Article

References (6)

1. See, for example, C. Deeney et al., Phys. Rev. E 51, 4823 (1995).
2. T. Nash et al., 8th Topical Conference on High Temperature Plasma Diagnostics, Hyannis. MA, 6-10 May 1990, Rev. Sci. Instrum. 61, 2804 (1990).
3. Manual for Low Magnification X-ray Streak Camera and Wafer Tube Intensifier, Kentech Instruments Ltd., Oxon OX11 9AG, UK, 17 March 1997.
4. S. H. Glenzer et al., Phys. Rev. E 55, 927 (1997).
5. R. W. Lee, B. L. Whitten, and R. E. Strout, J. Quant. Spectrosc. Radiat. Transf. 32, 91 (1984).
6. J. P. Apruzese, K. G. Whitney, J. Davis, and P. C. Kepple, J. Quant. Spectrosc. Radiat. Transf. 57, 41 (1997).