Radiation response of mos capacitors containing fluorinated oxides

IEEE Transactions on Nuclear Science

Volumn 34, Issue 6, 1987, Pages 1190-1195

  da Silva, Eronides F ^a   Nishiokat, Yasushiro ^a   Ma, T P ^a  

^a YALE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0010232132     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/TNS.1987.4337451     Document Type: Article

References (17)

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