Mueller matrix for characterization of one-dimensional rough perfectly reflecting surfaces in a conical configuration

Optics Letters

Volumn 23, Issue 14, 1998, Pages 1075-1077

  Luna, R E ^a,b   Acosta Ortiz, S E ^a   Zou, L F ^a  

^a CENTRO DE INVESTIGACIONES EN ÓPTICA   (Mexico)

^b UNIVERSIDAD AUTÓNOMA DE SINALOA   (Mexico)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0010227473     PISSN: 01469592     EISSN: None     Source Type: Journal    
DOI: 10.1364/OL.23.001075     Document Type: Article

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