Towards the calibration of the HETGS effective area

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3113, Issue , 1997, Pages 144-159

  Dewey, D ^a   Flanagan, K A ^a   Marshall, H L ^a   Baluta, C ^a   Canizares, C R ^a   Davis, D S ^a   Davis, J E ^a   Fang, T T ^a   Huenemoerder, D P ^a   Kastner, J H ^a   Schulz, N S ^a   Wise, M W ^a   Drake, J J ^a   Juda, J Z ^a   Juda, M ^a   Brinkman, A C ^a   Gunsing, C J Th ^a   Kaastra, J S ^a   Hartner, G ^a   Predehl, P ^a  

^a MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

AXAF; Calibration; Diffraction; Grating; X ray

Indexed keywords

CALIBRATION; LIGHT TRANSMISSION; OPTICAL RESOLVING POWER; SPECTROMETERS; X RAY DIFFRACTION ANALYSIS; X RAY OPTICS;

HIGH ENERGY TRANSMISSION GRATINGS (HETG);

DIFFRACTION GRATINGS;

EID: 0009992132     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.278843     Document Type: Conference Paper

References (21)

1. The high energy transmission grating spectrometer for AXAF
2. The high energy transmission grating spectrometer for AXAF
3. Computer aided design for the High Energy Transmission Grating (HETG) spectrometer
4. Fabrication of high energy x-ray transmission gratings for AXAF
5. Laboratory calibration of x-ray transmission diffraction gratings
6. Reflectance calibrations of AXAF witness mirrors using synchrtron radiation, 2-12 keV
7. Efficiency measurements and modelling of AXAF high energy transmission gratings
8. Modeling the diffraction efficiencies of the AXAF high energy transmission gratings
9. Modeling the diffraction efficiencies of the AXAF high energy transmission gratings: II
10. Calibration and characterization of HETG grating elements at the MIT X-ray grating evaluation facility
11. Transmission X-ray diffraction grating alignment using a photoelastic modulator
12. Modeling and analysis of x-ray emission line images acquired with a prototype model of the XMM reflection grating spectrometer