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Volumn 69, Issue 4, 1998, Pages 1814-1816

A direct method of extracting surface recombination velocity from an electron beam induced current line scan

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0009973408     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1148846     Document Type: Article
Times cited : (14)

References (25)
  • 17
    • 0002887012 scopus 로고
    • edited by D. B. Holt and D. C. Joy Academic, New York
    • D. B. Holt, in SEM Microcharacterization of Semiconductors, edited by D. B. Holt and D. C. Joy (Academic, New York, 1989), pp. 241-338.
    • (1989) SEM Microcharacterization of Semiconductors , pp. 241-338
    • Holt, D.B.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.