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Volumn 8, Issue 5, 1997, Pages 33-40

The emergence of nonlinear ioptics in the factory

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0009935596     PISSN: 10476938     EISSN: None     Source Type: Trade Journal    
DOI: None     Document Type: Article
Times cited : (8)

References (34)
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    • Of course, other inspection techniques may play key roles here, subject to cost/benefit tradeoffs, including x-ray, eddy current probes, thermal-wave imaging, and shearography. In some cases, a collection of these diagnostic tools, perhaps in concert with ultrasound, can form a "sensor suite" to more efficiently and accurately ascertain the state of the manufacturing process.
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    • Developed at Hughes Research Laboratories by Gil Dunning (shown in the photograph), Phil Mitchell, Marv Klein, Tom O'Meara, and David M. Pepper
    • Developed at Hughes Research Laboratories by Gil Dunning (shown in the photograph), Phil Mitchell, Marv Klein, Tom O'Meara, and David M. Pepper.
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    • Developed at Thomson-CSF by Henri Rajbenbach, Jean-Pierre Huignard, and their colleagues
    • Developed at Thomson-CSF by Henri Rajbenbach, Jean-Pierre Huignard, and their colleagues.
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    • Developed at Hughes Research Laboratories by David Rockwell, Alexander Betin, Steve Matthews, and Metin Mangir
    • Developed at Hughes Research Laboratories by David Rockwell, Alexander Betin, Steve Matthews, and Metin Mangir.


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