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Volumn 75, Issue 1, 1998, Pages 147-158
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2n-m designs with resolution III or IV containing clear two-factor interactions
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Author keywords
(Weak) minimum aberration design; Clear interaction; Fractional factorial design; Ineligible interaction and eligible interaction; Primary 62K15; Resolution; Secondary 62K05; Wordlength pattern
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Indexed keywords
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EID: 0009922346
PISSN: 03783758
EISSN: None
Source Type: Journal
DOI: 10.1016/S0378-3758(98)00122-0 Document Type: Article |
Times cited : (69)
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References (10)
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