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Volumn 38, Issue 6, 1995, Pages 1183-1189

Influence of low doped emitter and collector regions on high-frequency performance of SiGe-base HBTs

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0009905710     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/0038-1101(94)00242-8     Document Type: Article
Times cited : (16)

References (21)
  • 9
    • 0001946136 scopus 로고
    • Analysis and Numerik von Ladungstransport in Halbleitern
    • 2nd edn., Institut für Angewandte Analysis and Stochastik, Berlin
    • (1993) Report Nr. 6
    • Gajewski1
  • 18
    • 84919236696 scopus 로고    scopus 로고
    • F. Herzel, B. Heinemann and H. Gajewski, IEEE Trans. Electron Devices. Submitted.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.